Aquivos por Autor: Pedro, Jose; Gomes, Joao; Nunes, Luis

Title: Electro-Thermal and Trapping Characterization of AlGaN/GaN RF Power HEMTs
Author(s): Pedro, Jose; Gomes, Joao; Nunes, Luis
Source: 2021 IEEE BICMOS AND COMPOUND SEMICONDUCTOR INTEGRATED CIRCUITS AND TECHNOLOGY S… Continuar a ler →